As of July 24, 2005
for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)
X-ray fluorescence spectrometer analyzes minerals and soils on Mars (July 7, 2005)
X-ray analysis is a strong tool for speculating on the chemical and
physical weathering processes on Mars. The elemental compositions of
the bright dust, dark soil and other soil components collected at
different sites on Mars, such as the Gusev crater and Meridiani Planum,
have been determined by X-ray fluorescence spectrometers fitted to the
Mars Explorer Rovers. A comparison between the results obtained at both
sites generally shows that the bright dust is global in nature and not
dominated by the composition of local rocks, and also that the dark soil
has the same origin, while other soil components are fairly different.
For more information, see the paper, gAn integrated view of the
chemistry and mineralogy of martian soilsh, A. S. Yen
et
al., Nature, 436,
49-54 (2005).
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High resolution soft X-ray microscope capable of viewing 15 nm objects now available at Berkeley (June 30, 2005)
For many years, great efforts have been made around the world to develop
soft and hard X-ray microscopes. Very recently, scientists at Lawrence
Berkeley Laboratory, California, USA, have succeeded in fabricating an
extremely high-performance
objective lens, i.e., a
micro zone plate, which
projects a full-field image of the sample. The spatial resolution is 15
nm or even smaller for
synchrotron soft X-rays (150~1800 eV). The key point is the improvement
in electron beam lithography, since the spread due to electron
scattering has previously been a big problem when patterning. The
Berkeley team separately drew
two different zone-plate patterns and then
overlaid them very accurately.
For more information, see the paper, gSoft X-ray microscopy at a
spatial resolution better than 15 nmh, W. Chao
et
al., Nature, 435,
1210-1213 (2005).
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A table-top EUV microscope for nano sciences and technologies (May 30, 2005)
A joint research group from Russia, the Ukraine and the USA has
developed a table-top microscope, consisting of a pulsed extreme
ultraviolet (EUV) capillary discharge laser emitting at 46.9 nm, a
Schwarzschild condenser, a zone plate objective, and a CCD camera. To
reduce image-degrading effects such as speckle and interference, the
team shortened the laser's capillary tube length from 36 to 18 cm to
give a low-coherence beam with a pulse energy of around 0.1 mJ. The
spatial resolution is currently 100 nm. Typical exposure time is 20~70
seconds. For
more information, see the paper, gReflection mode imaging with
nanoscale resolution using a compact extreme ultraviolet laserh, F.
Brizuela et
al., Optics Express,
435, 1210-1213 (2005),
http://www.opticsexpress.org/abstract.cfm?URI=OPEX-13-11-3983
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Australian-Japanese collaboration in synchrotron sciences (June 3, 2005)
Australian Synchrotron and SPring-8 (Japan) have signed a new
partnership agreement to share expertise and develop new technology.
This agreement will allow scientists to move freely between both
facilities and to work together to exchange ideas and develop new
experimental technology, such as new detectors.
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PANalytical introduces MiniPal 4 EDXRF spectrometer (July 14, 2005)
PANalytical's new MiniPal 4 energy-dispersive XRF bench-top spectrometer
performs non-destructive analysis of elements from sodium to uranium, in
concentrations from 100% down to ppm levels. In addition to employing a
new silicon drift detector, its intelligent software can be useful for
fast elemental analysis across the entire periodic table. With a mass
of only 28 kg, it is configured with a 12-position sample changer (with
optional sample spinner), a helium gas attachment for liquids analysis
and a selection of X-ray tube anodes (Rh, Cr and other on request) for
analytical flexibility. For more information, Phone: +31-546-534444,
Fax: +31-546-534592,
info@panalytical.com,
http://www.panalytical.com/
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Bede offers combined XRR/XRF capability for rapid film thickness determination (July 13, 2005)
The latest version of the BedeMetrix(TM)-F X-ray metrology tool features
non-destructive, high-speed film thickness measurement on patterned
wafers through combined XRR (X-ray Reflectivity) and XRF (X-ray
Fluorescence), providing an extended thickness measurement range of 1nm
to 10 microns on a wide range of material types. Proprietary small spot
X-ray optics enable measurement on test pads and in scribe lines down to
100 microns for XRR, and 30 microns for XRF, for in-line measurement on
product wafers. For further information, Phone: +44-191-332-4700, Fax:
+44-191-332-4800,
info@bede.co.uk,
http://www.bede.com
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Rigaku releases horizontal-layout X-ray diffractometer for thin films (July 12, 2005)
Rigaku/MSC, Inc. has announced its new SmartLab system, which is a
horizontal sample mount x-ray diffractometer for thin films. This
product is designed to enable R&D of advanced thin film materials such
as: organic EL films for flexible displays, GaN epitaxial films for blue
lasers, and next generation magnetic films for ultra high density
magnetic recording media. Besides its sophisticated automation
software, the new systemfs high-resolution horizontal sample mount
geometry offers substantial benefits, such as preventing bending or
bowing of the sample. The system can handle samples up to 8" Ó. For
further information, contact: Thomas F. McNulty, Director, XRD Product
Marketing, Rigaku/MSC, Inc., Phone: +1-281-363-1033 ex.207,
tmcnulty@RigakuMSC.com,
http://www.RigakuMSC.com
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Oxford launches new handheld XRF analyzer for RoHS compliance screening (July 12, 2005)
Oxford Instruments has announced the new X-MET3000TXR — an X-ray
tube-based analyzer designed specifically for measuring heavy metals in
plastics, solder materials and printed circuit boards. The Restriction
of the use of certain Hazardous Substances (RoHS)
comes into force on 1st July 2006 in the US.
The product provides rapid quantitative analysis of all
restricted elements; Pb, Cd, Hg, Cr and Br. Various types of materials
can be measured with one instrument; cables, PCBs, components, plastic
housings, solder material, fasteners etc. X-MET can also be used as a
quick on-site quality control tool to analyze various other elements
like Ag, Cu, Bi etc from solder and Cl, Ti, Ca, Zn etc in plastics. For
further information, Phone: +1-510-656-8820, Fax: +1-510-656-8944,
info@ma.oxinst.com,
http://www.oxford-instruments.com/
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AMETEK acquires SPECTRO Analytical Instruments (June 13, 2005)
AMETEK, Inc. (NYSE: AME) has acquired SPECTRO Beteiligungs GmbH (gSPECTROh),
the holding company of SPECTRO Analytical Instruments GmbH & Co KG and
its affiliates. SPECTRO was acquired from an investor group led by
German Equity Partners BV for approximately 80 million Euro. SPECTRO
designs, manufactures, and services atomic spectroscopic instrumentation
used to analyze the elemental composition of solids and liquids.
SPECTRO joins AMETEK as part of its Electronic Instruments Group (EIG),
selling its instruments to the process, aerospace, power, and industrial
markets worldwide. For further information, contact SPECTRO Analytical
Instruments, Tom Milner, Phone:+ 49-2821-892-3106, Fax:
+49-2821-892-3206,
info@spectro.com
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For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.
http://www.SpectroscopyNow.com
Kenji Sakurai
Director, X-Ray Physics Group,
National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering,
Graduate School of Pure and Applied Sciences,
University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/