As of January 24, 2006
for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)
High-energy X-ray diffuse scatter aids in discovery of unexpected novel properties of ferroelectric material (January 15, 2006)
Generally, relaxor ferroelectrics exhibit a strong polarization
dependence on the applied electric field, which so far has been
explained by the behavior of the polar nano-regions (PNRs). Recently,
scientists at the U.S. Department of Energy’s Brookhaven National
Laboratory investigated the short-range polar order of Pb(Zn1/3Nb2/3)O3
(PZN) under an electric field. X-ray diffuse scattering is very
sensitive to local inhomogeneities and the results indicated an
unexpected redistribution of PNRs in real space, i.e., the PNR fields
preferred to line up perpendicular to the external field instead of
aligning with it. The experiments were done at the beamline X22B at the
National Synchrotron Light Source (NSLS, at Brookhaven National
Laboratory). For more information, see the paper,
“Electric-field-induced redistribution of polar nano-regions in a
relaxor ferroelectric”, G. Xu
et
al., Nature Materials,
in the January 15, 2006, online edition.
X-ray reflectivity from liquid-liquid interface reveals the limitations of classical Gouy-Chapman theory (January 13, 2006)
The distribution of ions in solution at an interface is key to the
fundamental understanding of electrochemistry as well as to the design
of materials and devices such as biomembranes. So far, classical
descriptions of ion distributions, such as the Guoy-Chapman theory (see,
G. Gouy, C. R. Acad. Sci. 149, 654 (1910) and D. L. Chapman,
Phil. Mag. Ser. 6 25, 475 (1913)), which ignores the details of
molecular structure, have been widely used. Professor M. Schlossman
(University of Illinois at Chicago) and his colleagues recently
performed very precise X-ray reflectivity measurements to obtain
experimentally ion distributions at the interface between solutions
(0.01 ~0.08M) of tetrabuytlammonium (TBA) tetraphenylborate (TPB) in
nitrobenzene and aqueous TBA bromide. They found significant deviations
from the Guoy-Chapman theory in describing their data. However, on the
other hand, molecular dynamics calculations produced potentials that
could be used to predict distributions with the Poisson-Boltzmann
equation without adjustable parameters. The experiments were done at
the Chemistry and Materials section of the Consortium for Advanced
Radiation Sources (ChemMatCARS) beamline 15-ID at the Advanced Photon
Source (APS, at Argonne National Laboratory). For more information, see
the paper, “Ion
Distributions near a Liquid-Liquid Interface”,
L. Guangming et
al., Science, 311,
216-218 (2006).
Cornel scientists propose new algorithm for wave propagation and phase retrieval in coherent X-ray diffraction imaging (January 6, 2006)
Imaging with coherent X-rays at high spatial resolution is a promising
technique for obtaining information on the internal structures of
non-crystalline specimens. Researchers at Cornell High Energy
Synchrotron Source (CHESS, Cornell University, USA) recently succeeded
in extending the Fresnel theory to retrieve phase information needed for
a full image reconstruction. The algorithm gives 3D full field imaging
with X-rays. This new scheme has been developed for coherent X-rays,
but the distorted-object concept can be applied to other diffraction and
imaging fields such as using visible light, electrons, and neutrons.
The method is particularly important with respect to the utilization of
future X-ray sources that have fully coherent photon beams. Part of their work was published in
Phys. Rev. B 72, 033103 (2005). For more information, visit
http://news.chess.cornell.edu/index.html
Synchrotron X-ray fluorescence confirms lead as cause of Beethoven's illness (December 6, 2005)
At the Advanced Photon Source (APS) at Argonne, USA, massive amounts of
lead have been detected in bone fragments of 19th Century composer
Ludwig von Beethoven
(1770-1827),
indicating the cause of his years of chronic illness. The bone
fragments, checked by DNA testing to have come from Beethoven's body,
were analyzed by micro X-ray florescence. The findings confirm earlier
work done on hair samples. Furthermore, neither cadmium nor mercury was
found within detectable levels this time. The half life of lead in the
human body is about 22 years, and almost 95 percent is captured in the
skeletal structure.
For more information, contact Catherine Foster, Phone: +1-630-252-5580,
cfoster@anl.gov,
http://www.anl.gov
U.K. and Japanese scientists named as laureates of the 2006 Japan Prize (January 11, 2006)
The Science and Technology Foundation of Japan announced the names of
the two laureates for the 2006 (22nd) Japan Prize. They are
U.K. scientist, Sir John Houghton CBE FRS, for "Pioneering research on
atmospheric structure and composition based on his satellite observation
technology and for promotion of international assessments of climate
change" in the prize category of "Global Change" and Dr. Akira Endo of
Japan for "The Discovery of the Statins" in the prize category of "The
development of Novel Therapeutic Concepts and Technologies". The two
scientists will receive certificates of merit, and commemorative medals.
There is also a cash award of fifty million Japanese yen for each prize
category. The presentation ceremony is scheduled to be held in Tokyo at
the National Theatre on Thursday 20 April 2006, in the presence of the
emperor and empress. The prize categories for the 2007 (23rd)
Japan Prize will be "Innovative Devices Inspired by Basic Research" and
the "Science and Technology of Harmonious Co-Existence". For further
details of the Japan Prize, contact The Science and Technology
Foundation of Japan, Phone: +81-3-5545-0551,
Fax +81-3-5545-0554,
info@japanprize.jp,
http://www.japanprize.jp/English.htm
Chinese plan to participate in the European XFEL project (November 24, 2005)
The X-ray free-electron laser (XFEL),
which will generate extremely brilliant, ultra-short X-ray pulses with
laser-like properties, opens up completely new possibilities for the
vast field of structural research. Within the framework of the meeting
of the XFEL Steering Committee in Berlin, two representatives of the
People's Republic of China's Ministry of Science and Technology signed
the Memorandum of Understanding for the European X-ray laser project
XFEL. Since the beginning of 2005, the ministries of science from 12
countries (Denmark, France, Germany, Great Britain, Greece, Hungary,
Italy, Poland, Russia, Spain, Sweden and Switzerland) have already
declared their intention to participate in the preparations for the
construction and operation of the XFEL. This research facility, which
will be unique in Europe, is due to commence operation in 2012. For
more information, contact
Petra Folkerts, Phone: +49-40-8998-4977, Fax: +49-40-8998-2020,
petra.folkerts@desy.de,
http://www.xfel.net
PANalytical introduces Semyos - EDXRF microspot analysis at a spot diameter of less than 23 μm (December 5, 2005)
PANalytical is launching its new EDXRF microspot wafer analyzer system:
Semyos. The system was introduced at Semicon Japan 2005. It has been
designed for on-product thin film metrology in in-line process control
applications for both the semiconductor and data storage industries.
With its <23 μm FWHM microspot, it is able to measure in the
scribelines on production wafers. The Semyos wafer analyzer is designed
for simultaneous determination of film thickness and composition coupled
with the ability to characterize single films and multi-layer stacks.
The detector employed is a Peltier-cooled Si Drift detector achieving a
resolution of 143 eV. Available in either a single or double load port
configuration, it comes with one or two 300mm FOUP openers, one or two
200mm SMIF POD openers or 100-300mm open cassette load modules combined
with FOUP or SMIF. For more information,
Phone: +31-546-534444, Fax: +31-546-534592,
info@panalytical.com,
http://www.panalytical.com/
Jordan Valley Semiconductors, Inc. introduces next-generation, X-ray based thin film metrology platform (December 1, 2005)
Jordan Valley Semiconductors, Inc. has announced the release of its JVXTM
6200 metrology tool platform, which combines second-generation fast
X-ray Reflectivity (XRR), improved micro-spot X-ray Fluorescence (XRF),
and industry leading Small Angle X-ray Scattering (SAXS). The new 6200
platform extends X-ray based film measurement and so is much more
suitable for high volume production fabs. The SAXS channel has the
capability to measure pore size and distribution in porous low-k films.
For additional information, contact Brenda Ortiz, Phone:
+1-866-515-5200,
http://www.jordanvalleysemi.com
Siemens releases dual source computer tomography system (November 17, 2005)
Siemens Medical Solutions has announced the world's first dual source
computed tomography (CT) system, the SOMATOM Definition, which is faster
than any existing CT technology, because it uses two X-ray sources and
two detectors at the same time, compared to all other CT systems that
use only one source and detector. At 0.33 second per rotation,
electrocardiogram- (ECG) synchronized imaging can be performed with
83-millisecond temporal resolution, independent of the heart rate,
resulting in motion-free cardiac images. The first SOMATOM Definition
was installed at the University of Erlangen (Germany) in October 2005
and is now used for technical and clinical research as well as regular
patient care. For further information, contact Holger Reim, Phone:
+49-9131 84-3473, Fax: +49-9131 84--3047,
holger.reim@siemens.com,
http://www.siemens.com/medical
Bruker AXS completes acquisition of SOCABIM (January 17, 2006)
Bruker AXS has announced that it has completed the acquisition of
privately held SOCABIM SAS, a company focused on advanced X-ray analysis
software for materials research. This acquisition was originally
announced on August 16, 2005, and was expected to close early in 2006.
For more information, contact Michael Willett, Public Relations &
Investor Relations Officer, Bruker BioSciences Corporation, Phone:
+1-978-663-3660 ext. 1411,
Michael.Willett@bruker-biosciences.com,
http://www.bruker-axs.de/
SII NanoTechnology and Carl Zeiss NTS announce sales alliance (January 17, 2006)
SII NanoTechnology Inc. and Carl Zeiss NTS GmbH, have jointly announced
a sales alliance. Based on this alliance, SII NanoTechnology will
commence marketing in Japan electron microscopes (Scanning Electron
Microscope: SEM, Transmission Electron Microscopes: TEM, and Ion
Microscopes: XB) produced by Carl Zeiss NTS. For more information,
contact Inoue,
Seiko
Instruments Inc. Corporate Communications Dept. Fax: +81-43-211-8011,
http://www.siint.com/en/contact/index.html
XCounter has announced that it is to float on AIM stock market(January 16, 2005)
Stockholm-based XCounter, which makes digital X-ray machines that can
produce 3D images using low levels of radiation, has announced plans to
float on AIM, which is London's junior stock market. The company, which
was founded in 1997 and run by a Swedish rocket scientist, hopes to
raise between
£12m
and £14m,
valuing the business at around
£54m.
Trading is expected to begin on 1 February. Nomura Code Securities is
acting as broker and nominated adviser to the float. For further
information, contact Tom Francke or Johan Stuart, Phone:
+46-8-622-23-00, Fax: +46-8-622-23-12,
info@xcounter.se,
http://www.xcounter.se
SpectroscopyNow.com
For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.
http://www.SpectroscopyNow.com
Kenji Sakurai
Director, X-Ray Physics Group,
National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering,
Graduate School of Pure and Applied Sciences,
University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/