As of May 26, 2006

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

Sciences

Time-resolved X-ray diffraction catches polarization switching in ferroelectric thin films (May 18, 2006)

The traditional tools of nanotechnology - the atomic force microscope and the scanning tunneling microscope - enable scientists to see atoms, but not their response to events, which at that scale occur in the order of nano seconds or shorter.  Professor P. Evans (Univ of Wisconsin-Madison) and his colleagues recently succeeded in visualizing domain wall motion during polarization switching of a Pb(Zr,Ti)O3 capacitor using time-resolved x-ray microdiffraction.  The work was done using Argonne National Laboratory's Advanced Photon Source, a synchrotron light source capable of generating very tightly focused beams of X-rays.  The X-rays are delivered to the sample in fast pulses over an area no larger than hundreds of nm.  For more information, see the paper, gNanosecond Domain Wall Dynamics in Ferroelectric Pb(Zr,Ti)O3 Thin Filmsh, A. Grigoriev et al., Phys. Rev. Lett. 96, 187601 (2006).
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X-ray observation of plastic deformation (May 12, 2006)

It is well known that a piece of metal deforms in an irreversible or plastic manner when it is bent.  This property is important from the standpoint of the feasibility of forming various types of metallic products as well as toughness as a structural material.  Scientists from Riso National Laboratory, Denmark recently tried taking gsnapshotsh with hard X-rays.  They observed some extremely interesting phenomena, i.e., the emergence and disappearance of the dislocation structure, which takes place during deformation.  For more information, see the paper, gFormation and Subdivision of Deformation Structures During Plastic Deformationh, B. Jakobsen et al., Science 312, 889 (2006).
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Focusing of hard X-rays to 30nm scale(March 31, 2006)

Extremely sharp focusing of hard X-rays has been achieved with a device called a Multilayer Laue Lens (MLL), recently developed at Argonne National Laboratory in the United States.  The device consists of a stack of alternating layers of metal and silicon, made by depositing progressively thicker layers.  The main idea is that the structure can work as a linear zone plate for X-rays.  The device has an ability to focus the X-rays with an energy level of 19.5 keV to 30 nm, which is almost the smallest beam size for hard X-rays.  Promising applications for a better X-ray lens would be in full-field and/or scanning probe microscopy.  For more information, see the paper, gNanometer Linear Focusing of Hard X Rays by a Multilayer Laue Lensh, H. C. Kang et al., Phys. Rev. Lett. 96, 127401 (2006)
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Professional

The SOLEIL synchrotron commences operation (May 14, 2006)

Located on the Plateau de Saclay, in the Essonne department, SOLEIL is the second 3rd-generation synchrotron to be built in France - the first one, the ESRF in Grenoble, was a European project.  Very recently, SOLEIL accelerated and injected electrons for the first time in its storage ring. On May 14, the electrons turned at a speed close to that of light in the 354 m circumference storage ring. The first 2.75 GeV beam injection from the Booster started around noon on May 13. After 12 hours spent on measurements and adjustments, the electrons made a full turn, and the first photon beams were observed.  For more information, visit http://www.synchrotron-soleil.fr/anglais/index.html
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First experiments completed at Hamburg's VUV-FEL (March 21, 2006)

The VUV-FEL (free-electron laser) at DESY in Hamburg is the worldfs first and, until 2009, the only source of intense laser radiation in the ultraviolet and the soft X-ray range. Since the official start in August 2005, a total of 14 research groups working on cluster physics, solid-state physics, plasma research and biology have carried out the first experiments.  The 300 m long facility generated laser flashes with a wavelength of 32 nm for the first time in January 2005, which is the shortest wavelength ever achieved with a free-electron laser.  The light flashes are shorter than 50 femto seconds, and this allows scientists to trace various processes on extremely short time scales by taking time-resolved "snapshots" of the reaction process.  For more information, visit http://www.xfel.net/en/index.html
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New Products

The latest-generation SPECTRO XEPOS EDXRF(May 15, 2006)

SPECTRO introduced the latest generation of the SPECTRO XEPOS energy-dispersive X-ray fluorescence analyser with polarized excitation at the ACHEMA industrial process trade show, Frankfurt am Main, May 15-19, 2006.  The analyzer is now equipped with a Si-drift detector to achieve finer detection limits than its predecessor, especially for the analysis of light elements.  The sample plate of the new XEPOS possesses 12 positions for samples between 32 and 40 mm in diameter, allowing automatic analysis for safe, unattended operation.  The typically expected target would be screening analyses required by RoHS for the electrical and electronics industries.  Other important applications are the chemical and petrochemical industries, the examination of ores and concentrates, and analysis of coatings.  For further information, contact Tom Milner, Phone: +49-2821-892-2102, Fax: +49-2821-892-2200, info@spectro.com

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ARL ADVANT'X: Thermo Electron's new XRF spectrometer (May 15, 2006)

Thermo Electron Corporation has announced the launch of a new wavelength-dispersive XRF instrument, the ARL ADVANT'X series with IntelliPowerTM Technology.  The spectrometer is available in three optimum power levels, 1.2, 3.6 and 4.2 kW.  All three products are configured to analyze a full spectrum of elements ranging from Be to U, and can be calibrated for the analysis of any unknown material (solids, liquids, loose powders).  Application software packages specifically designed for analysis of oxides, petrochemical products and other materials are available as well.  For further information, Phone: +1-800-532-4752, analyze@thermo.com, http://www.thermo.com/elemental

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METROTOM: Carl Zeiss' X-ray tomography instrument (May 9, 2006)

Carl Zeiss Industrial Metrology recently introduced METROTOM, a powerful computer 3D tomograph for industrial quality assurance.  The system makes visible the interior of a workpiece normally inaccessible to probing or optical sensors.  It is used to inspect the structure of material and also measures external features.  METROTOM permits the generation of CAD models.  For further information, contact, Alfons Lindmayer, Phone: +49-7364- 20-3539, Fax: +49-7364-20-4657, lindmayer@zeiss.de, http://www.zeiss.com/

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New Innov-X initiative to aid RoHS compliance (May 1, 2006)

Innov-X Systems is offering manufacturers and component suppliers the opportunity to build a simple yet effective RoHS compliance program by offering a low-cost trial XRF rental program for those engaged in EMS, OEM, and CM in order to put them at ease with testing and inspection without having to make a large financial commitment.  For further information, Phone: +1-781-938-5005, Fax: +1-781-938-0128, info@innovxsys.com, http://www.innov-x-sys.com/
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Oxford unveils Lab-X3500SCl bench-top XRF analyser (March 30, 2006)

Oxford Instruments has unveiled its Lab-X3500SCl analyser, which can determine low levels of S and Cl in petroleum products.  The detection limit for S is 3mg/kg (ppm) at a measuring time of 600 sec.  The instrument is precalibrated for sulfur methods and meets the specifications of the following standards: ISO 20847, ISO 8754, ASTM D4294, IP336, without the use of helium purge gas.  The analyser can be used anywhere and analysis is not affected by changes in ambient temperature or atmospheric pressure.  For more information, Phone: +44-1494 442255, Fax: +44-1494 461033, analytical@oxinst.co.uk, http://www.oxford-instruments.com/
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Corporate

Rigaku opens new regional X-ray user facility in USA (April 21, 2006)

Rigaku has announced the opening of a new multi-disciplinary analytical X-ray user facility in Cambridge, MA, USA.  The laboratory is equipped with the complete suite of Rigaku MiniLabTM X-ray diffraction and X-ray fluorescence products, and is available to prospective users at no cost.  Researchers in academia and industry who wish to explore the capabilities of modern analytical X-ray methods and instrumentation can reserve laboratory time for instrument training, the development of experimental methods, and open access instrument usage.  For further information, contact: George Stone, Rigaku Americas Corporation, Phone: +1-978-474-4660, George.Stone@Rigaku.com, http://www.rigakumsc.com/

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SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

http://www.SpectroscopyNow.com

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/
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