As of August 2, 2007

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

"Handbook of Practical X-ray Fluorescence Analysis" (B. Beckhoff, B. Kanngieber, N. Langhoff, R. Wedell and H. Wolf (Eds.), Springer-Verlag Berlin Heidelberg 2006, ISBN-10 3-540-28603-9)
　

The first impression one gets from looking at this book is that it is quite thick and looks heavy, and indeed, a wealth of information on modern XRF is densely packed into its 863 pages. In all, 69 scientists, mainly from Europe but also several from North America, South Africa and Japan have contributed articles on various aspects of the XRF technique; elements of XRF instruments, i.e., X-ray source (Chap. 2), optics (Chap. 3) and detector technologies (Chap. 4), as well as know-how regarding sample preparation (Chap. 6) and many applications (Chap.7 and others).  One of the most impressive sections of this book is 'Quantitative Analysis' (Chap. 5) authored by M. Mantler, J. P. Willis, G. R. Lachance, B. A. R. Vrebos, K. E. Mauser, N. Kawahara, R. M. Rousseau and P. N. Brower.  The chapter provides a good summary of each historically developed mathematical expression and discusses the issues related to errors and reliability, as well as standardization, which is significant in practical analysis.  The intensity of XRF correlates to the concentration of the corresponding element, but also depends on the matrix, i.e., concentration of other elements.  However, thanks to the well-established physical basis of XRF, calculations can explain measured XRF spectra to some extent.  In modern practical analysis, the most likely difficulty to be encountered is in preparing so-called 'standard samples' that have the same matrix of the unknown sample to be analyzed.  In such cases, one might wonder how one can depend on calculations, or which type of experimental data would help. Such problems are not new, but have yet to be fully resolved.  They are also likely to assume even greater importance in the future.  The book includes numerous stimulating applications in the area of micro area analysis with X-ray microbeams and ultra trace analysis using the total reflection condition (Chap. 7).  The use of synchrotron radiation contributed to pushing those techniques to state-of-the art levels, and development of such techniques is still in progress. The book delves into XRF instrumentation and seems particularly strong in X-ray optics (Chap. 3).  One can learn about the latest technological advances in great detail.  Progress in this area correlates to the advent of new sources, like synchrotrons and micro-focus laboratory X-ray sources.  Finally, in the last three pages, Chap. 8.2, there is a very useful list of sources and links, i.e., URLs, book names etc.  In short, owing to its sheer practicality, every X-ray laboratory should have a copy of the handbook, or even two or three.

Theoretical prediction of electromagnetically induced transparency for X-rays (June 22, 2007)

Electromagnetically induced transparency (EIT) is a coherent optical nonlinearity, and brings dramatic changes in optical properties such as absorption, emission, refraction etc.  The phenomena relate to the quantum mechanical overlapping state created by two different wavelengths of coherent light.  Recently, EIT for X-rays has been theoretically predicted. According to the theory, it is possible to make Ne gas, which is normally opaque, transparent by exposing it to laser light of 800 nm with extremely high flux of 10¹² W/cm².  The scheme could be used for producing ultra-short X-ray pulses.  For more information, see the paper, "Electromagnetically Induced Transparency for X Rays ", C. Buth et al., Phys. Rev. Lett., 98, 253001 (2007).  For more about general EIT, see, for example, "Electromagnetically Induced Transparency.", S. Harris, Physics Today, 50, 36-42 (1997).

X-ray spectroscopy aids understanding of how magnetic refrigeration works (June 15, 2007)

Scientists at Argonne National Laboratory and Ames Laboratory, Iowa State University, have recently performed X-ray magnetic circular dichroism (XMCD) measurements of giant magnetocaloric material, Gd₅(Ge_1-xSi_x)₄.  It was found that germanium becomes magnetic by spin-dependent hybridization between Ge 4p and Gd 5d.  This hybridization can change at the germanium-silicon bond-breaking transition, causing the destruction of magnetic ordering and leading to the giant magnetocaloric effect.  By combining the experimental results with calculations based on density functional theory, it was concluded that the magnetized germanium orbitals act as “magnetic bridges” in mediating the magnetic interactions across the distant gadolinium ions.  For more information, see the paper, "Role of Ge in Bridging Ferromagnetism in the Giant Magnetocaloric Gd₅(Ge_1-xSi_x)₄ Alloys", D. Haskel et al., Phys. Rev. Lett., 98, 247205 (2007).
　

Femtosecond-laser-driven X-ray source with 12 micron size and flux of 1,200 photons/mrad²/pulse (May 22, 2007)

A research group at the Japan Atomic Energy Agency (Kizugawa, Japan) has recently developed a novel table-top pulsed X-ray source.  The source employs a Ti:sapphire laser, emitting 70 fs duration 2 TW pulses of 800 nm wavelength at 10 Hz.  The laser beam is focused to the flow of high-density Ar gas.  The source was applied to perform phase contrast imaging.  For more information, see the paper, "Phase-contrast x-ray imaging with intense Ar Ka radiation from femtosecond-laser-driven gas target", L. M. Chen et al., Appl. Phys. Lett. 90, 211501 (2007).

DOE advances NSLS-II project (July 17, 2007)

The Department of Energy (DOE) in the US granted "Critical Decision 1" (CD-1) status to the National Synchrotron Light Source-II (NSLS-II), which will be a new medium energy storage ring and will replace the existing NSLS which began operations in 1982.  This decision assures the facility's location at Brookhaven National Lab.  For more about the NSLS-II project, visit the Web page, http://www.bnl.gov/nsls2/
　

First NIMS Award - W. H. Butler (July 11, 2007)

The National Institute for Materials Science, Japan, has announced that the first NIMS Award for recent breakthroughs in materials science and technology has been presented to Professor William H. Butler (Center for Materials for Information Technology, University of Alabama, USA) for the theoretical prediction of giant tunnel magnetoresistance (TMR).  Professor Butler performed the first principle calculation on tunnel conductance through MgO(001) single crystal thin film, and theoretically predicted the giant TMR effect of the Fe(100)/MgO/Fe(100) junction for the first time.  A giant TMR effect beyond ~500 % has now been realized, which is expected to make a substantial contribution to the development of novel spintronics devices and the creation of a new interdisciplinary field.
　

2007 Compton Award - A. Joachimiak & G. Rosenbaum (May 7, 2007)

The Advanced Photon Source (APS) and APS Users Organization has announced that the 2007 Arthur H. Compton Award has been presented jointly to Andrzej Joachimiak and Gerold Rosenbaum of Argonne National Laboratory for pioneering advances and leadership that helped to establish the APS as a premier location worldwide for protein crystallography research.  Former recipients of the award are: Gunter Schmahl and Janos Kirz (2005), Martin Blume, Doon Gibbs, Kazumichi Namikawa, Denis McWhan (2003); Wayne A. Hendrickson (2001); Sunil K. Sinha (2000); Donald H. Bilderback, Andreas K. Freund, Gordon S. Knapp, Dennis M. Mills (1998); Philip M. Platzman, Peter M. Eisenberger (1997); Nikolai Vinokurov, Klaus Halbach (1995).  For more information, contact Eleanor Taylor, Phone, +1-630-252-5565, etaylor@anl.gov
　

PANalytical’s new Axios-Minerals XRF package for elemental analysis of blast furnace slag (July 10, 2007)

Slag has many applications in the construction industry.  Reliable and repeatable analysis of the elemental composition of slag is essential for process control and to assess its suitability for specific applications.  PANalytical has announced that its Axios-Minerals wavelength dispersive XRF (WDXRF) spectrometer has overcome the need for reference materials to calibrate the system, because it now includes a set of multi-element wide-range oxide (WROXI) standards and the SuperQ Fundamental Parameters (FP) calibration model.  For further information, Phone: +31-546-534444, Fax: +31-546-534592, info@panalytical.com, http://www.panalytical.com/
　

Oxford's X-MET3000TXV+  - a new handheld XRF analyzer for quick sorting of high-value alloys in metal recycling (June 19, 2007)

Oxford Instruments has launched a new portable XRF analyzer, X-MET3000TXV+, which is equipped with a vacuum pump and now covers the measurement of silicon and magnesium in aluminum and the aluminum in titanium alloys that were previously not measurable with portable XRF instruments.  For further information, Phone: +44-1494 442255, Fax: +44-1494 461033, analytical@oxinst.co.uk, http://www.oxford-instruments.com/
　

Thermo Fisher Scientific launches 3^rd-generation handheld NITON XRF analyzers (June 3, 2007)
　

Thermo Fisher Scientific Inc. has announced the launch of the Thermo Scientific NITON XL3 Series, which is suitable for solder alloy grade identification and laboratory-quality composition analysis of plastics and polymers.  The typical time for routine solder screening measurements is less than 5 sec, or twice as fast as previous-generation NITON instruments.  The NITON XL3t is equipped with a 50 kV, 2-W X-ray tube, the most powerful X-ray tube ever offered in a handheld XRF analyzer.  For further information, contact Jennifer Robert, Phone: +1-978-670-7460 Ext. 392, Jen.Robert@thermofisher.com, http://www.thermo.com/niton
　

Shimadzu and Fujifilm ally in medical digital X-ray imaging market (July 4, 2007)

In Japan, Shimadzu Corporation and Fujifilm Corporation have announced an alliance in the medical X-ray imaging market.  Both companies will exchange products – X-ray sources and flat-panel detectors in the case of Shimadzu, and image processors and software in the case of Fujifilm – with a view to developing future generation medical inspection instruments.  For further information, Phone: +81-3-6271-2000 (Fujifilm), http://www.fujifilm.com/, or Phone: +81-3-3219-5641 (Shimadzu), http://www.shimadzu.com/,
　

Xradia delivers hard X-ray nanoprobe microscope to Argonne National Lab (June 22, 2007)

Xradia, Inc. has announced the delivery of the first hard X-ray nanoprobe instrument (nanoPi), which has been developed together with Argonne National Laboratory’s Center for Nanoscale Materials (CNM).  The nanoPi delivers high resolution of better than 30 nm at hard X-ray energies for elemental and structural analysis using scanning probe and full-field transmission X-ray microscopy.  The nanoPi has been installed at the hard X-ray Nanoprobe Beamline (ID-26) at Argonne’s Advanced Photon Source (APS).  For further information, Phone: +1-925-288-1228, Fax: +1-925-288-0310, sales@xradia.com, http://www.xradia.com/
　

SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/

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