As of February 2, 2008

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

Near-field speckle in coherent X-ray scattering (January 20, 2008)

A coherent X-ray beam produces a speckle pattern when it impinges on a sample.  Usually the size and shape of the speckle do not depend on the sample at all, but a group led by Professor M. Giglio (Universita degli Studi di Milano, Italy) recently found significant effects, observed when the detector is placed in the near field.  Conventional far-field techniques, because of the van Cittert and Zernike theorem, have limitations in the statistical analysis of speckles, but it has now become possible to generate static and dynamic X-ray-scattering data.  In addition, the present technique permits an increase of around four orders of magnitude in beam size and power.  The measurements were done at BM05, European Synchrotron Radiation Facility (ESRF) in Grenoble, France.  The peak energy was 12 keV and the beam size at the sample position was 1 mm × 1 mm.  For more information, see the paper, "X-ray-scattering information obtained from near-field speckle", R. Cerbino et al., Nature Physics, advanced online publication, DOI: 10.1038/nphys837

Quantitative reconstruction of layered materials by 3D XRF (January 8, 2008)

A German group led by Dr. B. Kanngiesser (Technische Universitat Berlin) has recently reported the significant extension of 3D micro X-ray fluorescence (XRF) spectroscopy.  Conventional XRF mapping is likely to remain a non-absolute analysis, since it just gives the spatial distribution of elements in the viewing region.  On the other hand, most realistic analytical applications require much greater quantitative imaging of chemical composition, density, thickness of layers etc.  The research group attempted to introduce a reliable quantification procedure, and obtained successful results in the case of stratified material.  For more information, see the paper, "Reconstruction of Thickness and Composition of Stratified Materials by Means of 3D Micro X-ray Fluorescence Spectroscopy", I. Mantouvalou et al., Anal. Chem. ASAP Article, DOI: 10.1021/ac701774d

A compact synchrotron light source driven by pulse laser (December 9, 2007)

Ultrashort X-ray photon pulses are powerful tools for time-resolved studies of molecular and atomic dynamics.  Free electron lasers remain the most promising source.  However, in the future, developing much more compact sources will become significant in widening the field of application.  A group led by Professor D. A. Jaroszynski (University of Strathclyde, UK) has recently reported the first successful combination of a laser-plasma wakefield accelerator, producing 55-75 MeV electron bunches, with an undulator to generate visible synchrotron radiation.  Here, the key would be the laser wakefield accelerator, which produces electron beams with energies from tens of MeV to more than 1 GeV within a few cm, with pulse durations of several fs.  Further improvements, particularly in the energy of electrons, could contribute to the generation of X-ray photons with ultrashort pulse-width as well as extremely high peak power.  For details on laser-plasma wakefield acceleration, see, for example, "Accelerator physics:  Electrons hang ten on laser wake", T. Katsouleas, Nature, 431, 515-516 (2004).  For more information on the present experiments, see the paper, "A compact synchrotron radiation source driven by a laser-plasma wakefield accelerator", H.-P. Schlenvoigt et al., Nature Physics, advanced online publication, DOI: 10.1038/nphys811
 

Pulse X-ray photons catch shock-induced lattice deformation in 100 ps time scale (December 7, 2007)

The lattice dynamics of materials under high strain is of great interest in materials science.  Japanese scientists led by Professors S. Adachi (KEK, Tsukuba) and S. Koshihara (Tokyo Tech Institute, Tokyo) have recently succeeded in observing the irreversible deformation process of CdS single crystal by single-shot time-resolved Laue diffraction.  The time-resolution here is 100 psec, which is a single-bunch X-ray pulse-width, available at the Photon Factory-Advanced Ring (6.5 GeV).  The data was obtained with various time delays in the order of nsec.  As the observed pattern exhibits six-fold symmetry of the wurtzite structure at 10 ns, corresponding to a shock pressure of 3.92 GPa, i.e., above the threshold pressure of phase transition to a rocksalt structure, they suggest a transient wurtzite structure.  For more information, see the paper, "Shock-induced lattice deformation of CdS single crystal by nanosecond time-resolved Laue diffraction", K. Ichiyanagi et al., Appl. Phys. Lett. 91, 231918 (2007).

Energy-dispersive XRS in transmission electron microscope unveils mysteries of solid-liquid system (November 30, 2007)

For many years, the simultaneous mapping of phases and chemical compositions subjected to extreme conditions has been one of biggest challenges in materials science.  Professor J. M. Howe (Virginia University, USA) and his colleagues have reported the successful study of partially molten Al-Si-Cu-Mg alloy particles, for automobile and aerospace applications, during in situ heating by energy-dispersive X-ray spectroscopy in a transmission electron microscope.  They have discovered some significant results, for instance, Al and Si concentrations change in a complementary and symmetric manner about the solid-liquid interface as a function of temperature.  They also obtained direct evidence for homogeneous nucleation of the Al-rich solid. For more information, see the paper, "In Situ Determination of the Nanoscale Chemistry and Behavior of Solid-Liquid Systems", S. K. Eswaramoorthy et al., Science, 318, 1437-1440 (2007).
 

Reference-free trace element determination by TXRF (October 15, 2007)

Dr. B. Beckhoff (Physikalisch-Technische Bundesanstalt, Berlin, Germany) and his colleagues have successfully performed a reference-free quantitation by total reflection X-ray fluorescence (TXRF) analysis in the soft X-ray region.  So far, element determination by XRF has been usually done with a calibration curve, which requires some reference samples.  However, there have been increasing demands for reference-free analysis, particularly in cases where stable and reliable reference samples are not easily obtained.  The fundamental parameter method, which is one of the most promising ways of performing such reference-free analysis, uses the theoretical XRF intensity expressed by Sherman's equation (or Fujino-Shiraiwa's formula), but appears to be highly dependent on geometrical factors, the spectral distribution of primary X-rays, and atomic fundamental constants etc.  In TXRF, the intensity is affected by additional conditions.  The experiments were done with monochromatic synchrotron radiation, at BESSY II.  The research group has developed a feasible sample chamber specially designed for quantitative XRF.  In addition, several calibrated detector systems have been employed to obtain reliable results.  For more information, see the paper, "Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation", B. Beckhoff et al., Anal. Chem. 79, 7873 -7882 (2007).

8th Ewald Prize – D. Sayre (January 21, 2008)

The international union of crystallography (IUCr) announced that Professor D. Sayre (Department of Physics, State University of New York, Stony Brook, NY 11794, USA) has been awarded the eighth Ewald Prize for the unique breadth of his contributions to crystallography, which range from seminal contributions to the solving of the phase problem to the complex physics of imaging generic objects by X-ray diffraction and microscopy, and for never losing touch with the physical reality of the processes involved.  The presentation of the Ewald Prize will be made during the Osaka Congress Opening Ceremony in August 2008.  Former recipients of the Ewald Prize are P. Coppens (USA, 2005), Michael M. Woolfson (UK, 2002), G. N. Ramachandran (India, 1999), M. G. Rossmann (USA, 1996), N. Kato (Japan, 1993), B.K. Vainshtein (Russia, 1990), J.M. Cowley (USA) and A.F. Moodie (Australia) in 1987.
 

Three US Scientists awarded 2008 Japan Prize (January 17, 2008)

The Science and Technology Foundation of Japan has announced that three US scientists have been named as laureates of the 2008 (24th) Japan Prize.  Dr. Vinton Gray Cerf, 64, Google Inc., and Dr. Robert Elliot Kahn, 69, Corporation for National Research Initiatives, have received the prize in this year's category of “Information Communication Theory and Technology”.  Dr. Victor A. McKusick, 86, the Johns Hopkins University, has been selected in another prize category of “Medical Genomics and Genetics.”  They will receive certificates of merit, and commemorative medals.  There is also a cash award of fifty million Japanese yen for each prize category.  The presentation ceremony is scheduled to be held in Tokyo at the National Theatre on Wednesday 23rd April, 2008.  The prize categories for the 2009 (25th) Japan Prize will be "The transformation towards a sustainable society in harmony with nature" and the "Technological integration of medical science and engineering".  For further information, contact Masaaki Ueda, The Science and Technology Foundation of Japan, Phone: +81-3-5545-0551, Fax: +81-3-5545-0554, info@japanprize.jp, http://www.japanprize.jp/English.htm

The 1^st X-ray reflectivity school in Japan (November 29, 2007)

The 1^st tutorial course on the analysis of thin films and multilayers by X-ray reflectivity was held in Tsukuba, Japan, on November 29-30.  The first and second days were for beginners and experts, respectively, but most of the total of 63 participants attended both of them.  The textbook distributed at the school will be published in 2008.  The 2^nd course will take place in March 2008.  Further information is available at http://www.nims.go.jp/xray/ref/ (in Japanese only).
 

Malvern's latest chemical imaging analysis software (January 22, 2008)

Malvern Instruments has announced the release of ISys 5.0, the latest version of its chemical imaging analysis software.  ISys 5.0 builds on already strong support for third party platforms.  For more information, visit http://www.malvern.com/

SLICE software now available from HORIBA Jobin Yvon (January 10, 2008)

HORIBA Jobin Yvon has announced that it has agreed with xk, Inc. to become the exclusive provider of SLICE software to the XRF community. SLICE, the Spectral Library Identification and Classification Explorer, is designed to archive, query, and compare X-ray spectra.  The software was developed under an FBI contract to save time and improve the accuracy of evidence identification, and to create an advanced archiving tool, allowing spectra, images, and text to be seamlessly linked.  It has become a widely-used tool in forensic laboratories where virtually any material can be encountered, and its use is now being extended to contaminant analysis in a wide range of industries, including the pharmaceutical, automotive, engine wear and semiconductor industries. For more information, contact Simon FitzGerald, Phone:+44-20-8204-8142, info@jobinyvon.co.uk, http://www.jobinyvon.co.uk

Rigaku's energy-dispersive XRF spectrometer (December 19, 2007)

Rigaku has announced the release of its EDXL 300, which is an energy-dispersive X-ray fluorescence spectrometer equipped with efficient optics based on exchangeable secondary targets as well as a Si drift detector.  The spectrometer covers a wide range of applications from environmental analysis to inspection and screening in industries.  For further information, visit http://www.rigaku.com/index_world.html

Bruker acquires elemental analysis company JUWE Laborgeraete GmbH (January 3, 2008)

Bruker AXS GmbH has announced that it has signed an agreement to acquire all of the equity of privately-held JUWE Laborgeraete GmbH, which has many years of experience in combustion analysis of light elements such as C, H, N, O and S.  A stock purchase agreement was signed on December 21, 2007 and the transaction is expected to close in the first quarter of 2008.  JUWE's estimated 2007 revenue was approximately $3 million.  For further information, contact Michael Willett, Phone: +1-978-663-3660, ext. 1411, ir@bruker-biosciences.com, http://www.bruker-axs.com/

SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/