As of May 28, 2008

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

Further analysis of silica on Mars (May 23, 2008)

In May 2007, NASA's Mars rover Spirit found that Martian soil has a high concentration of silica.  This is considered as very strong evidence that water could have existed on ancient Mars, because certain hydrothermal reactions are most likely to produce silica.  The discovery was announced in brief at the time (see http://www.nasa.gov/mission_pages/mer/mer-20070521.html), but scientists led by Professor S. Squyres (Cornell University, United States) have now had time to fully analyze the mineral deposits.  In addition to the Miniature Thermal Emission Spectrometer (Mini-TES), the Alpha Particle X-ray Spectrometer (APXS) contributed significantly to the analysis.  Analysis of the elemental composition of the deposits revealed that Si is strongly enriched relative to typical soil, and there are weaker enrichments in Ti, Cr, and Zn.  Other major elements appear to be depleted.  For more information, see the paper, "Detection of Silica-Rich Deposits on Mars", S. W. Squyres et al., Science, 320, 1063 (2008).

Soft X-ray microscope observation of spin-torque-induced vortex gyration (April 30, 2008)

Spintronics is now one of the most important keywords in modern sciences and technologies.  The currently employed method for magnetic recording uses electrical current pulses, and there appear to be limitations for extremely high density devices (e.g., G-bit level MRAM).  One of the most promising solutions is the use of spin polarized current in a ferromagnetic medium, which can provide a spin-transfer torque to the magnetization, resulting in its motion.  To develop high-density and very fast devices, it is indispensable to obtain a fundamental understanding of what really takes place there.  Recently, a research group led by Dr. G. Meier (Hamburg University, Germany) succeeded in visualizing spin-torque-induced vortex gyration in micrometer-sized permalloy squares using a 30nm-resolution X-ray microscope at the Advanced Light Source (ALS), Berkeley, United States.  The phases of the gyration in structures with different chirality have been analyzed considering alternating spin-polarized currents and the current's Oersted field.  For more information on the present experiments, see the paper, "Time-Resolved X-Ray Microscopy of Spin-Torque-Induced Magnetic Vortex Gyration", M. Bolte et al., Phys. Rev. Lett., 100, 1701 (2008).

XRD tomography (April 20, 2008)

Progress in nano sciences requires further development of local structural probes, particularly for the study of non-uniform materials.  As material functions are often concerned with heterogeneity and some hierarchical orders of the structures, some kind of zooming from low to high resolution will become crucial in the future.  Furthermore, in addition to two-dimensional (2D) imaging of an object with a lateral resolution determined by the beam size, some depth resolution is important for a better understanding of materials.  So far, X-ray techniques have had several limitations with respect to such points.  Recently, French scientists led by Professor J-L. Hodeau (CNRS, Grenoble, France) have reported an interesting development.  They are trying to combine pencil-beam tomography with X-ray diffraction to examine unidentified phases in nanomaterials and polycrystalline materials.  The experiments were for a high-pressure pellet containing several carbon phases and a heterogeneous powder containing chalcedony and iron pigments.  For more information, see the paper, "Probing the structure of heterogeneous diluted materials by diffraction tomography", P. Bleuet et al., Nature Materials, 7, 468 (2008).

New way to distinguish chirality by X-ray diffraction (April 8, 2008)

X-ray Bragg diffraction can determine crystal structures.  So far, however, distinguishing between right- and left-handed crystals has not been done by ordinary X-ray diffraction.  Japanese scientists led by Professor S. Shin (RIKEN & The University of Tokyo) recently succeeded in revealing the chirality of crystals by measuring Bragg diffraction near the absorption edge, using circular polarization of synchrotron X-rays at the SPring-8.  Reflections only allowed at resonant conditions have been well interpreted for the α-quartz case.  For more information, see the paper, "Right Handed or Left Handed? Forbidden X-Ray Diffraction Reveals Chirality", Y. Tanaka et al., Phys. Rev. Lett., 100, 145502 (2008).

The next undulator source to look at orbital angular moment (March 24, 2008)

It is known that a helical undulator does not generate any higher-order harmonics on the central radiation axis.  As such, off-axis radiation in higher-order harmonics has been considered useless, but so far this problem has not been discussed further.  Professor S. Sasaki and his colleagues (Argonne National Lab, USA) have recently published an interesting paper about this problem.  They found that all the harmonics except the fundamental from a variable polarizing undulator, such as an Advanced Planar Polarized Light Emitter (APPLE) device, are expressed by Laguerre-Gaussian modes carrying orbital angular momentum, when it is phased to deliver circularly polarized radiation.  As the advent of polarized X-ray sources has dramatically expanded the understanding of magnetism, the availability of intense X-ray beams carrying orbital in addition to spin angular momentum could open the door to new condensed matter research via X-ray scattering and spectroscopy methods.  For more information, see the paper, "Proposal for Generating Brilliant X-Ray Beams Carrying Orbital Angular Momentum", S. Sasaki et al., Phys. Rev. Lett., 100, 124801 (2008).

X-ray reflectivity schools in Japan and France (May 8, 2008)

There appears to be increasing demand for learning analytical techniques for surfaces and interfaces.  In Japan, the 2^nd tutorial course on the analysis of thin films and multilayers by X-ray reflectivity was held on March 26.  Although a similar school was run only 4 months earlier, an additional 50 young participants came to Tsukuba for the course.  In France, the 3^rd school was held at Giens on May 4-8.  The organizers were Professors A. Gibaud (Université du. Maine), R. Lazzari (Institut des NanoSciences de Paris) and J. Daillant (Institut Rayonnement Matière de Saclay).  Of particular note is that SAXS, GI-SAXS and In-plane XRD have been newly included in the program, in addition to ordinary X-ray reflectivity.  Further information is available at http://www.nims.go.jp/xray/ref/ (in Japanese only) and http://www.univ-lemans.fr/~gibaud/ecoledegiens/ (in French only), respectively.

Japanese decorations for spring 2008 (April 29, 2008)

The Japanese government has released the list of recipients of this year's spring decorations, comprising 3,973 Japanese and 51 foreign nationals, for their contributions to the nation and public in politics, business, culture and the arts.  Readers of X-Ray Spectrometry would be interested to know that Sir Martin Wood, one of the founders of Oxford Instruments, received The Order of the Rising Sun, Gold Rays with Neck Ribbon.  An official explanation of Japanese decorations and medals can be found at http://www8.cao.go.jp/english/decoration/index.html  Wikipedia carries a comprehensive introduction at http://en.wikipedia.org/wiki/Order_of_the_Rising_Sun

JAAS issue devoted to synchrotron radiation (March 10, 2008)

Issue 6, vol. 23 (2008) of the Journal of Analytical Atomic Spectroscopy (JAAS) is devoted to the theme of synchrotron radiation.  As guest editors, Professors A. von Bohlen and M. Tolan (Technische Universitat Dortmund, Germany) compiled 1 critical review and 7 regular papers.  The title and the first authors are as follows:  “Synchrotron radiation induced TXRF”, C. Streli et al., 792, “Synchrotron radiation and cultural heritage: combined XANES/XRF study at Mn K-edge of blue, grey or black coloured palaeontological and archaeological bone material”, I. Reiche et al., 799, “The barium giant dipole resonance in barite: a study of soft X-ray absorption edges using hard X-rays”, C. Sternemann et al., 807, “Non-destructive, depth resolved investigation of corrosion layers of historical glass objects by 3D Micro X-ray fluorescence analysis”, B. Kanngieser et al., 814, “Applications of synchrotron-based micro-imaging techniques to the chemical analysis of ancient paintings”, M. Cotte et al., 820, “A combination of synchrotron and laboratory X-ray techniques for studying tissue-specific trace level metal distributions in Daphnia magna”, B. De Samber et al., 829, “Sodium sulfate heptahydrate: a synchrotron energy-dispersive diffraction study of an elusive metastable hydrated salt”, A. Hamilton et al., 840, “Reference-free X-ray spectrometry based on metrology using synchrotron radiation”, B. Beckhoff, 845.  In the editorial column, the editors point out some very interesting facts on the number of publications in the field of synchrotron radiation applications.  They investigated the ISI Web of Science database and found that 1991 was a critical year.  The relevant Figure shows a big jump in the number of publications, somewhat resembling an absorption edge.  This jump no doubt correlates to the several year delayed big pulses, i.e., the advent of the 3^rd generation sources, ESRF (1994), APS (1996) and SPring-8 (1997).

PANalytical unveils new petrochemical standard sets for XRF (May 21, 2008)

PANalytical (Almelo, The Netherlands) has introduced a series of new petrochemical standard sets for X-ray fluorescence (XRF).  The standard sets are made by VHG Labs, and are available for: wear metals, lubrication oils, sulfur in diesel fuel and sulfur in oil.  They contain standards in 50 ml bottles, consumables, a calibration template and a performance testing sample for independent verification of the calibration.  For further information, visit the web page, http://www.panalytical.com/

EDAX launches APOLLO XV SDD (May 1, 2008)

EDAX Inc., has launched the Apollo XV SDD, the latest generation of silicon drift detectors for X-ray microanalysis.  The energy resolution is 128eV and 52eV, at around Mn and C Kα X-ray energy, respectively.  EDAX is a unit of AMETEK Materials Analysis Division.  For further information, Phone:+1-(201)529-4880, Fax:+1-(201)529-3156, info.edax@ametek.com, http://www.edax.com/

Bruker releases TOPAS V4 software (April 8, 2008)

Bruker AXS GmbH recently released its TOPAS V4 software for structure analysis.  The main features supported are (i) the Charge Flipping method for ab-initio structure determination (Oszlanyi & Suto, 2004; Coelho, 2007), (ii) 3D Fourier maps for completion of partial structure models, and (iii) Variable Counting Time (VCT) data, taking advantage of the best possible data quality achievable.  For quantitative phase analysis, the PONKCS method (Scarlett & Madsen, 2006) is fully supported, allowing the accurate quantification of compounds, where the classic Rietveld method fails.  For further information, visit the following page, http://www.bruker-axs.de/

Oxford acquires Link Analytical (May 28, 2008)

Oxford Instruments plc has announced the acquisition of the business and assets of Link Analytical AB from Anna Otterstrom, the current owner.  Link’s primary activity is the distribution and after-sales support of Oxford Instruments NanoAnalysis equipment in Scandinavia.  For further information, contact Jonathan Flint or Kevin Boyd, Phone: +44-1865 393 200, or visit the web page, http://www.oxford-instruments.com/

Spectro opens Japanese office and demonstration facility (May 20, 2008)

Spectro Analytical Instruments has opened an instrument demonstration and application laboratory along with a direct sales, service and marketing office in Tokyo near Shinagawa station; address, Shinagawa NSS Bldg, 13-31 Kohnan 2-chome Minato-ku, Tokyo 108-0075, Phone: +81-3-37405172, Fax: +81-3-37405307.  In addition, SPECTRO and EDAX operate a joint sales and marketing office in Osaka, Japan; address, Shin-Osaka Yachiyo Bldg., 1-45, Miyahara 4-chome, Yodogawa-ku, Osaka 532-003, Phone: +81-6-63503815, Fax: +81-6-63503825  For further information, visit the web page, http://www.ametek.com/

PANalytical announces new training course program (April 30, 2008)

PANalytical (Almelo, The Netherlands) has announced details of more than 50 training courses for both introductory and in-depth training, covering all areas of X-ray diffraction (XRD) and X-ray fluorescence (XRF) spectroscopy.  The program is delivered at PANalytical centers around the world.  For further information, visit the web page, http://www.panalytical.com/

Rigaku wins award at the ELRIG protein crystallography conference (April 21, 2008)

Rigaku Americas Corporation announced the receipt of the "Most Innovative New Technology" award for the Desktop Minstrel UV, an ultraviolet crystal imaging and analysis system, and CrystalMation, an automated crystallization system, at the European Laboratory Robotics Interest Group (ELRIG) protein crystallography conference, held in Cambridge, U.K. on April 1, 2008.  For further information, contact Craig Sterling, Phone: +1-760 438 5282 Ext 129, craig.sterling@rigaku.com, or visit the web page, http://www.rigaku.com/

SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/