As of September 21, 2005

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

Sciences

Ultra fast X-ray diffraction - watching the birth and death of exotic molecules (August 19, 2005)

Some very interesting structural studies have been performed recently at the European Synchrotron Radiation Facility (ESRF), Grenoble, France, on photo-chemically generated, short-lived (<10-6 sec) iodo radicals.  The research team dissolved a molecule of C2H4I2 in liquid methanol and then subjected it to a short laser pulse.  This excited the molecule, which then cooled down while releasing heat into the surrounding liquid.  As a consequence, the temperature rose and the liquid started to expand in response to the increase in temperature.  The absorption of light triggered a chemical reaction, which the researchers studied with picosecond time resolution.  The research team measured the change in shape and composition as early as 100 picoseconds after the initial explosion, then at an interval of 10 nanoseconds, then 1 microsecond and so on.  From these measurements, the team obtained direct structural evidence of the bridged radical (CH2ICH2) in a polar solution.  This transient intermediate has long been hypothesized to explain stereo-chemical control in many association and/or dissociation reactions involving haloalkanes.  For more information, see the paper, gUltrafast X-ray Diffraction of Transient Molecular Structures in Solutionh, H. Ihee et al., Science, 309, 1223-1227, (2005).
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Synchrotron X-ray microprobe contributes to development of cheaper solar cells (August 14, 2005)

Professor E. Weber's team at Berkeley, California, US has recently succeeded in finding a new technique to handle metal defects in low-grade silicon, which could dramatically reduce the cost of solar cells. At present, around 90 % of solar cells in the world are made from a refined, highly purified form of silicon. This is because solar cells made from cheaper forms of silicon do not perform well and also because removing impurities is expensive.  The new idea is to manipulate the impurities in a way that reduces their detrimental impact on the solar cell, instead of purifying the material.  The team analyzed how metal contaminants in silicon respond to different types of processing using a synchrotron X-ray microprobe capable of detecting metal clusters as small as 30 nanometers.  In addition to micro-XRF and micro-XAFS, they employed a new method based on a spectrally resolved X-ray-beam-induced current, which generates a map of the minority-carrier diffusion length, revealing the precise impacts of metal impurity clusters on local material performance.  They found that they were able to manipulate the distribution of the metal impurities by varying the cooling rate of the silicon.  When the material is cooled quickly, the metal defects are quickly locked in a scattered distribution. For more information, see the paper, gEngineering metal-impurity nanodefects for low-cost solar cellsh, T. Buonassisi et al., Nature Materials, 4, 676-679 (2005).
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X-ray analysis reveals why anthocyanin found in red roses turns other flowers a brilliant blue (August 11, 2005)

It is known that the colours of many flowers are produced by anthocyanin, which has 6 different types of structure; a cyanidin-type anthocyanin is responsible for the red in roses, while most blue flowers have delphinidin-type anthocyanin.  However, the same cyanidin-type anthocyanin makes roses red but cornflowers blue.  The phenomenon has so far not been entirely explained.  A Japanese group led by Professor K. Takeda (Tokyo Gakugei University, Koganei, Tokyo) recently carried out detailed X-ray analysis and clarified that a complex of six molecules each of anthocyanin and flavone, with one ferric iron, one magnesium and two calcium ions is responsible for the blue in cornflowers.  For more information, see the paper, gPhytochemistry:  Structure of the blue cornflower pigmenth, M. Shiono et al., Nature, 436, 791 (2005).
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Brilliant X-ray source assists in the discovery of a novel stable high-pressure form of silica with a pyrite-type structure (August 5, 2005)

The mineral silica (SiO2) is a common substance that is a constituent of all of the planets in our solar system.  At SPring-8, Harima, Japan, Dr. K. Hirose (Tokyo Institute of Technology; Japan Agency for Marine-Earth Science and Technology) and his co-workers recently found that, above 268 GPa and 1800 K, silica exhibits a novel stable high-pressure form with a pyrite-type structure, which is much denser than other known silica phases.  This form of silica could be one of the main constituents of the core of a gas-giant planet such as Uranus or Neptune.  For more information, see the paper, gThe Pyrite-Type High-Pressure Form of Silicah, Y. Kuwayama et al., Science, 309, 923-925 (2005).
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Professional

VUV free-electron laser starts at DESY (August 3, 2005)

The first user operation of the VUV free-electron laser (FEL) at DESY, Hamburg in Germany is now under way.  German Chancellor Gerhard Schroeder paid a visit to the facility to join the celebrations.  The VUV-FEL employs the new technology developed at DESY from 1992 to 2004 by the international team as part of the TESLA Collaboration.  Electrons are brought to high energies by a superconducting linear accelerator, and then race through an undulator, which is a periodic arrangement of magnets that forces the electrons to follow a slalom course and thereby radiate flashes of light.  According to self-amplified spontaneous emission (SASE), the process finally generates intense flashes of short-wavelength laser light.  Its peak brilliance surpasses that of the most modern synchrotron radiation sources by a factor of ten million.  Its radiation is coherent, and its wavelength is tunable within a range of 6 to 30 nm.  The very intense radiation pulses have an extremely short duration of 10~50 femto seconds.  Five experimental stations have been constructed at the facility.  For more information, visit the Web page, http://www.desy.de
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Denver X-Ray Conference Awards (August 3, 2005)

The following awards were presented during the plenary session of the 54th Annual Denver X-Ray Conference:

The 2005 Barrett Award in X-ray Diffraction to D. Keith Bowen – Bede Scientific Instruments, Ltd., Durham, UK and Brian Tanner – University of Durham, Durham, UK
The 2005 Jenkins Award for Lifetime Achievement in the Advancement of the Use of X-rays for Materials Analysis to Victor E. Buhrke – Consultant, Portola Valley, CA
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New Products

Hamamatsu releases new X-ray flat panel sensor with low noise and high resolution (September 15, 2005)

Hamamatsu Photonics K.K., a Japanese company manufacturer of photomultiplier tubes, light sources, imaging tubes, opto-semiconductors, and other imaging and analyzing systems, recently announced a new X-ray flat panel sensor, the C10013SK.  The 1.1-million-pixel sensor has quite a large area of 50mm ~ 50mm.  Each pixel is equipped with an individual amplifier, thereby allowing the enhancement of the signal to background ratio.  The Gd2O3 scintillator is employed with specifically designed fiber optics.  For more information, contact T. Inutsuka, Phone +81-53-434-3311, Fax +81-53-434-5184, http://www.hamamatsu.com/
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Kodak introduces new digital imaging systems for molecular imaging (September 1, 2005)

Eastman Kodak Co. has announced the availability of two new products, the Image Station In-Vivo F and FX systems, developed for in-vivo molecular imaging, which makes possible non-invasive measurement of biological processes at a molecular level within a living organism.  The In-Vivo FX system includes a digital X-ray imaging module in addition to its optical imaging capability.  In contrast to conventional diagnostic imaging that highlights conditions caused by disease, molecular imaging can identify molecular abnormalities that are the origin of disease at a very early stage.  For additional information, call +1-203-786-5657, or visit http://www.kodak.com/go/molecular
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EMT added XRF analysis as part of RoHS test methods (August 23, 2005)

Environmental Monitoring and Technologies, Inc. (EMT), Morton Grove, Illinois, which conducts testing of materials to detect substances of concern addressed in the Restriction of Hazardous Substances in Electronic and Electrical Equipment (RoHS) Directive, recently announced the addition of X-ray fluorescence (XRF) to the suite of analytical test methods offered for the evaluation of electronic and electrical components.  The XRF method is promising from the standpoint of compiling material content declarations, specifically for the determination of various metals and brominated compounds in plastics and alloys.  While XRF analysis does not provide definitive results for all of the RoHS-regulated substances, it has, however, several clear advantages including a rapid turnaround of results and the ability to perform non-destructive testing.  For more information, contact Kris Erickson, Phone: +1-(847) 324-3346, Fax: +1-(847) 967-6735, info@emt.com, http://www.emt.com/
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Bruker AXS announces AUTOSTRUCTURE software for automated X-ray structure determination (August 23, 2005)

Bruker AXS Inc. has launched AUTOSTRUCTURE, a program suite for the automatic determination of 3D crystal structures of organic, mineralogical and inorganic molecules from X-ray data.  Through collaboration with the University of Durham, UK, the software requires only approximate information on elemental composition from the user.  It then processes diffraction intensity data and cascades through Patterson, direct and dual space methods to propose a structure model within seconds.  The software is suitable for use in chemical crystallography as well as peptide and small protein structures of moderate resolution.  For further information, contact Roger Durst, executive vice president, Phone +1-608-276-3066, roger.durst@bruker-axs.com, http://www.bruker-axs.de/
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Corporate

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SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

http://www.SpectroscopyNow.com

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/

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