As of July 21, 2006

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

Grazing incidence X-ray scattering reveals that liquid AuSi alloy shows solid-like crystal structure at surface (July 7, 2006)

Professor P. Pershan (Harvard University, USA) and his colleagues recently found a crystalline monolayer at the surface of the eutectic liquid Au₈₂Si₁₈, at temperatures above the alloy's melting point.  This is unusual for a liquid surface, as the atomic arrangements are ordinarily strongly disordered.  In addition, they found that the gold-silicon eutectic alloy has 7-8 layers near its surface, whereas many metallic liquids typically show only 2-3 distinct atomic layers.  The phenomena are considered as indicative of surface freezing.  The research group employed X-ray reflectivity and grazing incidence X-ray diffraction techniques for the analysis.  For more information, see the paper, �gSurface Crystallization in a Liquid AuSi Alloy�h, Oleg G. Shpyrko et al., Science 313, 77 (2006).
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Coherent X-ray diffraction reveals real space 3D structures of nanocrystals (July 6, 2006)

The appearance of the ultimate X-ray microscope, with atomic-scale resolution and capable of seeing deep inside objects, has long been awaited.  Professor I. Robinson (University College London, UK) and his team recently made a significant step towards realizing this dream, using the technique of coherent X-ray diffraction imaging, the possibility of which was first pointed out by Sayre (Acta Crystallogr. 5, 843 (1952)) but not demonstrated until 1999 by Miao et al (Nature 400, 342 (1999)). They observed the growth of nanometer-sized Pb crystals inside the vacuum chamber.  The results showed that asymmetries in the diffraction pattern can be mapped to deformities, providing a detailed 3-D map of their location in the crystal.  This new method shows that the interior structure of atomic displacements within single nanocrystals can be obtained by direct inversion of the diffraction pattern.  The technique is an attractive alternative to electron microscopy because of the superior penetration of materials of interest by the electromagnetic waves, which are often less damaging to the sample than electrons.  The experiments were done at beamline 34-ID-C at the Advanced Photon Source (APS) in the United States.  For more information, see the paper, �gThree-dimensional mapping of a deformation field inside a nanocrystal�h, Mark A. Pfeifer et al., Nature 442, 63 (2006).
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X-ray absorption spectroscopy gives new insights into how DVD works (June 28, 2006)

Scientists at North Carolina State University, USA recently published an interesting report on the significance of the anomalously high concentration of local Ge-Ge bonds in amorphous Ge₂Sb₂Te₅, which is commonly used in data storage technologies such as DVD, DVD-RAM etc. The ability to change phases from a crystalline to a non-crystalline state is what allows the DVD to take and hold data.  While the basic properties of this alloy are well known, there are still a lot of unsolved problems: we do not know how the process works on a microscopic level.  The paper indicates that the amorphous phase is an ideal network structure in which the average number of constraints per atom equals the network dimensionality.  For more information, see the paper, �g"Application of Bond Constrain Theory to the Switchable Optical Memory Material Ge₂Sb₂Te₅", D. A. Baker et al., Phys. Rev. Lett. 96, 255501 (2006).
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Time-resolved X-ray spectroscopy catches catalytic reaction on gold nanoparticles (June 21, 2006)

A series of very interesting experiments has been performed at beamline ID26 at the European Synchrotron Radiation facility (ESRF), Grenoble, to see how gold nanoparticles catalyze carbon monoxide (CO) with oxygen (O₂) into carbon dioxide (CO₂).  High-energy resolution X-ray absorption spectroscopy reveals how the oxygen becomes chemically active when bound to the particles.  The reaction took place when the scientists switched from a flow of O₂ to one of CO - the O₂ bound to the gold reacts with the CO to form CO₂.  The technique can be applied to a variety of reactions.  For more information, see the paper, �gActivation of Oxygen on Gold/Alumina Catalysts: In Situ High-Energy-Resolution Fluorescence and Time-Resolved X-ray Spectroscopy�h, Jeroen A. van Bokhoven et al., Angewandte Chemie, published online June 21, 2006.
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Workshop on 'buried' interface science with X-rays and neutrons (July 4, 2006)

A workshop on 'buried' interface science with X-rays and neutrons was held in Yokohama, Japan, on July 3-4.  This was one in a series of workshops that have been organized annually since 2001.  The precise and non-destructive analysis of nano-structures (dots, wires etc), which are most likely to be 'buried' under several capping layers, has become extremely important from the standpoint of fundamental understanding as well as its application to electronic, magnetic, optical and other devices.  Unfortunately, most sophisticated surface-sensitive techniques are not helpful in such cases, but reflectometry and other related methods using X-rays and neutrons are very promising because they are able to explore atomic-scale structures along their depth.  Besides the variety of applications, the workshop also featured intensive discussions of several advanced extensions and/or upgrades of the method.  One of the most interesting directions is the combination of the method with grazing-incidence small angle scattering (GISAS).  Professor Alain Gibaud (Université du Maine, France) was invited to give a lecture on this topic.  Another invited speaker from outside Japan was Dr. Burkhard Beckhoff (Physikalisch-Technische Bundesanstalt, Germany).  The workshop proceedings are available from Science Information and Library Service Division, High Energy Accelerator Research Organization (KEK), Phone: +81-29-864-5137, Fax: +81-29-864-4604, irdpub@mail.kek.jp.  Another workshop contact, particularly with respect to future plans, is Kenji Sakurai, sakurai@yuhgiri.nims.go.jp.
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Series of workshops linked to Cornell�fs Energy Recovery Linac (ERL) projects (June 24, 2006)

Cornell High Energy Synchrotron Source (CHESS) invited researchers from around the world to a series of workshops focused on cutting-edge sciences that will be built up by the proposed Energy Recovery Linac (ERL), which is a next-generation light source.  The series of six two-day workshops was held at the Robert Purcell Community Center, Ithaca, NY, USA, between June 5 and June 24.  The workshops covered high-pressure science, ultra-fast processes, materials science, studies of soft-matter, biology, and science with X-ray nanobeams.  For more information on ERL, visit http://erl.chess.cornell.edu/
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PANalytical introduces Oil-Trace package for complete XRF analysis of oil and fuels (July 11, 2006)

PANalytical, has launched Oil-Trace, a new package that enables complete XRF analysis of all types of fuels, oils and oil derivatives.  Oil-Trace has been specifically designed to overcome the traditional difficulties associated with analysis of oils.  Automatic correction of dark-matrix composition and variations in sample density and volume can contribute to reducing the number of calibrations usually needed for different sample types.  Oil-Trace is designed for use with wavelength-dispersive X-ray fluorescence (WDXRF) systems.  It is supplied complete with liquid standards for the characterization of the sample matrix in terms of C, H and O, analysis templates and tools.  For further information, Phone: +31-546-534444, Fax: +31-546-534592, info@panalytical.com, http://www.panalytical.com/
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WARD�fS Natural Science and Brookhaven Lab develop science education kits (July 10, 2006)

Through a Cooperative Research and Development Agreement, the U.S. Department of Energy�fs Brookhaven National Laboratory and WARD�fS Natural Science of Rochester, NY, have developed four science education kits, which are used as hands-on learning tools in the classroom for middle school, high school, and college students.  Marketed by WARD�fS, the kits focus on environmental chemistry and life science.  WARD�fS catalog of science education kits can be found at http://www.wardsci.com/
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Xradia announces new X-ray transmission microscopes for advanced semiconductor packaging (June 28, 2006)

Xradia, Inc., recently announced the sale of three of its MicroXCT^TM 3D transmission X-ray microscopes to semiconductor manufacturers for advanced packaging process development and failure analysis.  Combining spatial resolution below 1.5ƒÊm and feature recognition of 500nm, with full 3D tomography capability, the microscope is suited to the inspection of C4 ball grid arrays, multi stacked die, flip-chip architectures, solder bumps and packaging interconnects.  For further information, Phone: +1-925-288-1228, Fax: +1-925-288-0310, sales@xradia.com, http://www.xradia.com/
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e2v scientific instruments introduces SiriusSD (June 15, 2006)

e2v scientific instruments has launched the SiriusSD, an electrically cooled solid-state silicon drift detector with a new electronic design.  It is directly compatible with existing systems, making it easy to integrate with, and thus upgrade, energy-dispersive X-ray materials analysis equipment.  The SiriusSD range includes designs for integration with scanning electron microscopes (SEM) and X-ray fluorescence (XRF) systems.  e2v scientific instruments is the only independent EDX detector company that offers true worldwide support, with repair and upgrade facilities based in both Europe and the USA.  For further information, contact Joanne Bugg, Phone +1-914-593-6841, joanne.bugg@e2v.com, http://www.e2vsi.com/
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Rigaku SmartLab wins 2006 R&D 100 Award (July 6, 2006)

Rigaku Americas Corporation has announced that the SmartLab (automatic X-ray diffractometer) has won the 2006 R&D 100 Awards.  The award has been presented annually since 1963 by R&D Magazine.  Over the years, the R&D 100 Awards have recognized winning products with such household names as Polacolor film (1963), the flashcube (1965), the automated teller machine (1973), the halogen lamp (1974), the fax machine (1975), the liquid crystal display (1980), the printer (1986), the Kodak Photo CD (1991), the Nicoderm antismoking patch (1992), Taxol anticancer drug (1993), lab on a chip (1996), and HDTV (1998).  Last year, the Bruker AXS VANTEC-2000 detector was selected for the 2005 R&D 100 Award.  Further details of the award can be found at http://www.rdmag.com/100win.aspx.  The winners of the 2006 R&D 100 Awards will be listed in the September issue of R&D Magazine.
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Spellman in Valhalla, NY achieves ISO 9001:2000 (June 29, 2006)

Spellman High Voltage Electronics Corporation, an independent manufacturer of high voltage DC power supplies for X-ray instruments, has announced that its Valhalla, New York location has attained ISO 9001:2000 certification, completing the certification process for all of Spellman's manufacturing locations worldwide.  In 1994, Spellman High Voltage was the first company in the high voltage electronics industry to achieve ISO 9001:2000 certification.  For information on the ISO 9000 & 14000 families of quality and environmental management standards, visit http://www.iso.org/iso/en/iso9000-14000/index.html.  For technical information on Spellman products, Phone: +1-631-630-3000, http://www.spellmanhv.com/.
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PANalytical opens direct sales and support operation in Korea (April 1, 2006)

PANalytical (Almelo, The Netherlands) has commenced business in Korea directly as a PANalytical entity under the aegis of Spectris Korea, instead of through its agent - the SongJee Industrial Corporation.  SongJee and PANalytical have worked together for the past 12 years.  The strength of this association is reflected in the new organization with all SongJee employees joining PANalytical Korea.  A "Memorandum of Understanding" (MoU) was signed by Mr. JP Song, President of SongJee Industrial Corporation, and Dr. Guido Eggermont, Commercial Director of PANalytical BV, in mid-January.  For further information, Phone: +31-546-534444, Fax: +31-546-534592, info@panalytical.com, http://www.panalytical.com/
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SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/