As of January 26, 2009

for international journal X-Ray Spectrometry (John Wiley & Sons Ltd.)

Possibility of near diffraction-limit size X-ray beam by higher order harmonic generation (January 11, 2009)

Laser generation in the X-ray region has become realistic because of the construction of free electron laser facilities, which will be available in the near future (Linac Coherent Light Source (LCLS) at Stanford in 2009; European XFEL in 2014).  Another significant route is the extension of existing laser technologies such as high-order harmonic generation (HOHG), particularly from relativistically oscillating plasma mirror-like surfaces.  Professor M. Zepf (Queens University Belfast, UK) and his colleagues recently published an interesting paper showing that it is possible to achieve a near-diffraction-limited focal spot size that is also controllable.  For more information, see the paper, "Diffraction-limited performance and focusing of high harmonics from relativistic plasmas", B. Drome et al., Nature Physics, advanced online publication doi:10.1038/nphys1158

A method for realizing sub-angstrom spatial resolution in diffractive imaging of single nanocrystals (December 21, 2008)

Diffractive imaging is a technique for so-called lens-less microscopy, and uses diffraction intensity (image) and phase retrieval calculations rather than focusing systems such as lenses, which are not free from aberrations.  The spatial resolution is basically limited only by the amount of high-angle scattering.  Therefore, the technique has been considered as having the potential to achieve atomic resolution for hard X-rays or other short-wavelength particle beams.  However, so far, the reported results have been still at the level of several nanometers.  Recently, a research group at the University of Illinois, USA proposed a method of improving the resolution.  One of the biggest technical reasons limiting the spatial resolution of diffractive imaging is the difficulty of recording weak coherent scattering signals.  The research group proposes the combined use of low-resolution imaging, which provides the starting phase, real-space constraint, missing information in the central beam and essential marks for aligning the diffraction pattern.  The group used an electron microscope to see a single CdS quantum dot with sub-angstrom resolution and noted that it is possible to use the same procedure in the case of coherent X-ray scattering.  For more information, see the paper, "Sub-angstrom-resolution diffractive imaging of single nanocrystals", W. J. Huang et al., Nature Physics, advanced online publication doi:10.1038/nphys1161

Calculation of Kα spectra for double ionization case (November 10, 2008)

Professor L. Natarajan (University of Mumbai, India) recently published a paper calculating the energies and electric dipole rates of X-rays from the empty K shells of atoms in the range of Z=12 to 56.  For more information, see the paper, "Relativistic fluorescence yields for hollow atoms in the range 12<Z<56", L. Natarajan, Phys. Rev. A78, 052505 (2008).
 

Further development of inversion technique for the analysis of X-ray and neutron reflectivity data (May 16, 2008)

Analysis of X-ray and neutron reflectivity is usually done by modeling the scattering length density profile (such as multilayers) of the sample and performing a least square fit to the measured, phaseless reflectivity data.  Professor T. Salditt (Institute for X-ray Physics, Universitat Gottingen) and his colleague recently attempted to extend the inversion technique.  The research group discussed conditions for uniqueness, which are applicable in the kinematic limit (Born approximation), and for the most relevant case of box model profiles with Gaussian roughness.  They also demonstrated that an iterative method to reconstruct the profile based on regularization works well.  For more information, see the paper, "Iterative reconstruction of a refractive-index profile from x-ray or neutron reflectivity measurements", T. Hohage et al., Phys. Rev. E77, 051604 (2008).
 

Modeling of damage dynamics in X-ray free-electron-laser irradiation (April 1, 2008)

As an X-ray free-electron laser (X-FEL) provides extremely strong pulses, it is necessary to understand the photon-induced damage processes for biological samples.  A research group led by Dr. Chapman (DESY, Germany and Lawrence Livermore National Lab, USA) has discussed how several aspects of existing continuum damage models can be tested during early operation of X-FEL at lower X-ray energies in the range of 0.8-5 keV and low fluences, focusing particularly on macroscopic collective effects such as particle charging, expansion, and average ionization of nanospheres.  For more information, see the paper, "Modeling of the damage dynamics of nanospheres exposed to x-ray free-electron-laser radiation", S. P. Hau-Riege et al., Phys. Rev. E77, 041902 (2008).

Two US scientists awarded 2009 Japan Prize (January 15, 2009)

The Science and Technology Foundation of Japan has announced that two US scientists have been named as laureates of the 2009 (25th) Japan Prize.  Dr. Dennis L. Meadows, 66, Professor Emeritus of Systems Policy, University of New Hampshire and one of the authors of the report, “The Limits to Growth,” for the Club of Rome in 1972, has received the prize in this year's category of “Transformation towards a sustainable society in harmony with nature”.  Dr. David E. Kuhl, 79, Professor of Radiology, University of Michigan Medical School, was selected in the other prize category of “Technological integration of medical science and engineering”.  They will receive certificates of merit, and commemorative medals.  There is also a cash award of fifty million Japanese yen for each prize category.  The presentation ceremony is scheduled to be held in Tokyo at the National Theatre on Wednesday 23rd April, 2009.  The prize categories for the 2010 (26th) Japan Prize will be "Industrial Production and Production Technology" and "Biological Production and Environment".  For further information, visit the Web page, http://www.japanprize.jp/en/index.html
 

Department of Energy approves construction of NSLS-II (January 12, 2009)

The U.S. Department of Energy (DOE) has granted "Critical Decision 3" (CD-3) status to the National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory, approving the start of construction in fiscal year (FY) 2009 and scheduling completion in FY 2015.  A total project cost for NSLS-II of $912 million has been approved.  NSLS-II is expected to be the world’s first storage-ring-based synchrotron light source that combines nanometer spatial resolution with high brightness, coherence, and beam stability, enabling nanometer-scale characterization of materials, with powerful applications in nanotechnology and biotechnology.  For more information about the NSLS-II project, visit the website at http://www.bnl.gov/nsls2/
 

Obituary - Eugene P. Bertin (December 2, 2008)

Eugene P. Bertin, author of the most famous XRF textbooks and a very popular instructor in XRF courses, has died at the age of 86, in his apartment in Harrison, NJ, USA.  Dr. Bertin was a student at the University of Illinois, in Urbana and received his B.S., M.S., and finally PhD in 1952, in Analytical/Inorganic Chemistry.  He worked at the RCA Research Center in Princeton, NJ for many years.  Dr. Bertin made many contributions to X-ray spectroscopy.  He was the principle lecturer at the “Short summer course in X-ray spectrometry” (organized by Professor Henry Chessin, State University of New York at Albany), and also at ICDD XRF courses.  His textbooks, “Principles and Practice of X-Ray Spectrometric Analysis” (Plenum, 1970 (first edition), 1975 (second edition)) and “Introduction to X-Ray Spectrometric Analysis” (Kluwer Academic Pub, 1978) were recognized as the best in the world and were hallmark texts used by thousands of people all over the world.  Reviews of these books have been published in X-Ray Spectrometry journal (See, 1, 45 (1972), 4, A18 (1975), 8, v (1979)).  Another interesting review is found in J. Appl. Cryst., 5, 387 (1972).  Dr. Bertin was a recipient of the Birks Award at the 1988 Denver Conference.  One of his best friends, Dr. V. E. Buhrke has posted an article, “Testimonial and Obituary - in honor of Dr. Eugene P. Bertin, PhD” to the XRF-L mailing list, which can be also read at (http://listserv.syr.edu/scripts/wa.exe?A2=ind0812&L=xrf-l&T=0&F=&S=&P=1003).
 

Obituary - Andrew Lang (June 30, 2008)

Andrew Lang, Emeritus Professor of Physics at the University of Bristol, has died.  Born in 1924 at St Annes-on-Sea in the UK, Professor Lang obtained a First-Class Honours London External BSc in Physics at Exeter in 1944, a London External MSc in 1947 and a Cambridge PhD in 1953.  He worked in industrial research in the UK (Lever Brothers and Unilever Ltd) and in the USA (Philips Laboratories, Irvington-on-Hudson, NY).  He was Assistant Professor of Physical Metallurgy at Harvard University (1954-1959) before moving to the University of Bristol.  He became Professor of Physics in 1979.  Professor Lang achieved fame for his pioneering studies in X-ray diffraction physics, especially his original technique of X-ray topography, i.e., the ‘Lang method’ or ‘Lang Camera’, which displays the internal imperfections in a crystal, such as dislocations, stacking faults, growth-sector boundaries and ferromagnetic domains.  The method has been widely used in the non-destructive assessment of crystals for the electronics and diamond industries, among others.  Professor Lang studied many types of X-ray diffraction phenomena, including variations from Bragg’s law, X-ray moire patterns and other types of fringes.  One of his most important discoveries (in collaboration with Professor N. Kato (1923-2002)) was the presence of interference fringes in wedge-shaped perfect crystals, leading to a precise measure of absolute structure amplitude from a unit cell (See the paper, ”A study of pendellosung fringes in X-ray diffraction”, Acta Cryst. 12, 787 (1959)).  Professor Lang is also known for his research using other techniques, such as electron microscopy and cathode-luminescence.  In 1964, he was awarded the Charles Vernon Boys Prize of the Institute of Physics and the Physical Society.  He was elected a Fellow of the Royal Society in 1975 and was awarded the Royal Society Hughes Medal in 1997.  An obituary by Professor M. Moore can be found in the Journal of Applied Crystallography, 41, 825 (2008).  The Independent (August 25, 2008) carried an obituary as well.
 

Obituary - Vadim I. Nefedov (June 28, 2008)

IRD unveils X-ray photodiode (January 12, 2009)

International Radiation Detectors, Inc. (IRD) has announced the AXUV 100GX X-ray photodiode.  The new X-ray detector is fully calibrated, and makes it possible to perform absolute measurement of X-ray flux with energies even over 100 keV.  The detector features a large (10 mm x 10 mm square) active area with room-temperature operation and a small detector footprint.  It requires no external voltage for operation.  The nitrided-oxide front window provides up to a Gigarad (SiO2) of radiation hardness which is 10,000 times greater than standard PIN silicon photodiodes.  For more information, visit the Web page, http://www.ird-inc.com/
 

Miniature synchrotron (January 7, 2009)

Lyncean Technologies, Inc., which was founded in Palo Alto, California, in 2001 by Stanford Professor Ronald Ruth’s group, recently announced that its Compact Light Source (CLS) successfully performed hard X-ray phase contrast imaging.  Some results appear on the cover of the January 2009 issue of the Journal of Synchrotron Radiation.  The CLS is a miniature synchrotron which uses inverse Compton scattering to produce high-intensity, tunable, quasi-monochromatic X-ray beams.  For more information, visit the Web page, http://www.lynceantech.com  Their first scientific results are published in the paper, “Hard X-ray phase-contrast imaging with the Compact Light Source based on inverse Compton X-rays”, M. Bech et al., J. Synchrotron Rad. 16, 43 (2009).
 

Rigaku’s latest wavelength-dispersive XRF spectrometer (January 7, 2009)

The ZSX3 is the latest member of Rigaku's innovative ZSX family of wavelength dispersive XRF instruments.  The 3.0 kW spectrometer, which has a tube-below design, comes with either a vacuum or helium environment for measurement.  For more information, visit the Web page, http://www.rigaku.com/index_en.html


 

Aribex receives second patent for handheld X-ray system (January 19, 2009)

Aribex, Inc., has announced that it has been allowed a second U.S. patent for its NOMAD Handheld X-ray System.  The latest patent (Appl. # 20070269010) protects the central concept of having all components of the X-ray system in the same enclosure.  This concept led to the development of the world’s first handheld X-ray system.  The previous patent #7,224,769 (October of 2007) was for the digital X-ray camera.  For more information, visit the Web page, http://www.aribex.com/

 

SpectroscopyNow.com

For additional news about X-ray analysis and other spectroscopy sciences, browse the Wiley website.

Kenji Sakurai
Director, X-Ray Physics Group, National Institute for
Materials Science (NIMS)
and Professor, Doctoral Program in Materials Science and
Engineering, Graduate School of Pure and Applied Sciences,
 University of Tsukuba
1-2-1, Sengen, Tsukuba, Ibaraki 305-0047 Japan
Phone : +81-29-859-2821, Fax : +81-29-859-2801
sakurai@yuhgiri.nims.go.jp
http://www.nims.go.jp/xray/lab/