The following awards were presented during the plenary session of the 54th Annual Denver X-Ray Conference:
The 2005 Barrett Award in X-ray Diffraction to D. Keith Bowen - Bede Scientific Instruments, Ltd., Durham, UK and Brian Tanner - University of Durham, Durham, UK
The 2005 Jenkins Award for Lifetime Achievement in the Advancement of the Use of X-rays for Materials Analysis to Victor E. Buhrke - Consultant, Portola Valley, CA
