Workshop on 'buried' interface science with X-rays and neutrons

A workshop on 'buried' interface science with X-rays and neutrons was held in Yokohama, Japan, on July 3-4. This was one in a series of workshops that have been organized annually since 2001. The precise and non-destructive analysis of nano-structures (dots, wires etc), which are most likely to be 'buried' under several capping layers, has become extremely important from the standpoint of fundamental understanding as well as its application to electronic, magnetic, optical and other devices. Unfortunately, most sophisticated surface-sensitive techniques are not helpful in such cases, but reflectometry and other related methods using X-rays and neutrons are very promising because they are able to explore atomic-scale structures along their depth. Besides the variety of applications, the workshop also featured intensive discussions of several advanced extensions and/or upgrades of the method. One of the most interesting directions is the combination of the method with grazing-incidence small angle scattering (GISAS). Professor Alain Gibaud (Université du Maine, France) was invited to give a lecture on this topic. Another invited speaker from outside Japan was Dr. Burkhard Beckhoff (Physikalisch-Technische Bundesanstalt, Germany). The workshop proceedings are available from Science Information and Library Service Division, High Energy Accelerator Research Organization (KEK), Phone: +81-29-864-5137, Fax: +81-29-864-4604, irdpub@mail.kek.jp. Another workshop contact, particularly with respect to future plans, is Kenji Sakurai, sakurai@yuhgiri.nims.go.jp.