Denver X-Ray Conference Awards

The following awards were presented during the plenary session of the 55th Annual Denver X-Ray Conference:
The 2006 Birks Award: Peter Wobrauschek, Atominstitut, Vienna University of Technology, Vienna, Austria.
The 2006 Jerome B. Cohen Student Award (two recipients): Hanfei Yan, Columbia University, New York, NY, and Argonne National Laboratory, Argonne, IL won the award for his work "Dynamical Artifacts in X-ray Diffraction from Single Crystals"; Wanchuck Woo, The University of Tennessee, Knoxville, TN and Oak Ridge National Laboratory, Oak Ridge, TN won the award for his work "In-Situ Time-Resolved Neutron Diffraction Measurement of Transient Material States during a Thermo-Mechanical Process Based on Quasi-Steady State Principle".
The 2006 Hanawalt Award: Peter Wallace, Dos Arroyos Enterprises, Oro Valley, AZ.