The 1st X-ray reflectivity school in Japan

The 1^st tutorial course on the analysis of thin films and multilayers by X-ray reflectivity was held in Tsukuba, Japan, on November 29-30. The first and second days were for beginners and experts, respectively, but most of the total of 63 participants attended both of them. The textbook distributed at the school will be published in 2008. The 2^nd course will take place in March 2008. Further information is available at http://www.nims.go.jp/xray/ref/ (in Japanese only).