Lensless X-ray camera for nano materials

A joint research group from the USA and Australia, led by Dr. J. Miao (University of California-Los Angeles) recently published the first results of resonant X-ray diffraction microscopy for element specific imaging of buried structures with a pixel resolution of ~15 nm by exploiting the abrupt change in the scattering cross section near electronic resonances. They performed nondestructive and quantitative imaging of buried Bi structures inside a Si crystal by directly phasing coherent X-ray diffraction patterns near the Bi-MV edge. For more information, see the paper, "Nanoscale Imaging of Buried Structures with Elemental Specificity Using Resonant X-Ray Diffraction Microscopy", C. Song et al., Phys. Rev. Lett., 100, 025504 (2008).