Quantitative reconstruction of layered materials by 3D XRF

A German group led by Dr. B. Kanngiesser (Technische Universitat Berlin) has recently reported the significant extension of 3D micro X-ray fluorescence (XRF) spectroscopy. Conventional XRF mapping is likely to remain a non-absolute analysis, since it just gives the spatial distribution of elements in the viewing region. On the other hand, most realistic analytical applications require much greater quantitative imaging of chemical composition, density, thickness of layers etc. The research group attempted to introduce a reliable quantification procedure, and obtained successful results in the case of stratified material. For more information, see the paper, "Reconstruction of Thickness and Composition of Stratified Materials by Means of 3D Micro X-ray Fluorescence Spectroscopy", I. Mantouvalou et al., Anal. Chem. ASAP Article, DOI: 10.1021/ac701774d