Our lab signed a Memorandum of Understanding (MOU) for research collaboration on the "nanotechnology-driven advanced materials metrology research, X-ray physics and its industrial metrology applications, nanoscale materials characterizations" with Center for Measurement Standards (CMS), Industrial Technology Research Institute (ITRI), Taiwan. The two institutions agreed to promote exchanges of researchers, information, publication of the results of the research and/or the implementation of cooperative research. Both sides are interested in developing and establishing novel advanced metrology as well as the international standardization in Asia-Pacific region.
The significance of the collaboration between NIMS and ITRI was first discussed during the 2007 APEC Nanoscale Measurement Technology Forum, held in Taipei, September, 2007. Dr. Kenji Sakurai (NIMS, Group Leader, Quantum Beam Center) gave an invited lecture on X-ray metrology for nanotechnologies there.
