An international symposium on micro and trace X-ray analysis was held in Osaka, Japan, on February 12-14, with financial aid from the Japan Science and Technology Agency (JST). Professor K. Tsuji (Osaka City Univ.) organized the symposium, which had 102 participants including 12 scientists from outside Japan. In addition to highly sophisticated analytical experiments with brilliant synchrotron radiation, recent progress regarding the instrumentation and applications of laboratory/mobile X-ray sources was extensively discussed. The speakers were as follows; P. Wobrauschek (Atominstitut, TU Wien), K. Janssens (Antwerp Univ.), A. Hokura (Tokyo Univ. of Sci.), K. Nakano (Osaka City Univ.), A. von Bohlen (ISAS Institute for Anal. Sci.), S. Maeo (Osaka Electro-Comm. Univ.), Y. Kataoka (Rigaku), G. Havrilla (Los Alamos National Lab), C. Numako (Tokushima Univ.), K. Hayashi (Tohoku Univ.), T. Sakae (Nihon Univ.), K. Sakurai (National Inst. for Materials Sci.), S. Hayakawa (Hiroshima Univ.), K. Tsuji (Osaka City Univ.), S. B. Dabagov (INFN, Frascati), N. Gao (X-Ray Optical Systems, Inc.), H. Soejima (Shimadzu), K. Taniguchi (Inst. of X-ray Tech. Co., Ltd), J. E. Fernandez (Bologna Univ.), H. Kumagai (Osaka City Univ.), A. Bando (Horiba Ltd.), K. Yamauchi (Osaka Univ.), B. De Samber (Ghent Univ.), Y. Kagoshima (Hyogo Univ.), C. Streli (Atominstitut, TU Wien), P. Pianetta (SLAC, Stanford), S. Shimoyama (Kibi International Univ.), R. Van Grieken (Antwerp Univ.). The proceedings booklet is available from the organizer, Phone/Fax: +81-6-6605-3080, tsuji@a-chem.eng.osaka-cu.ac.jp
