Influence of coherent length on TXRF and XSW

Dr. A. von Bohlen (Institute for Analytical Sciences, Germany) and his colleagues recently published an interesting paper on the analysis of nanoparticles prepared on the substrate by grazing incidence X-ray Standing Waves (XSW) and Total Reflection X-ray Fluorescence (TXRF). The influence of coherence length of X-rays from different X-ray sources, the particle form, particle size and distribution are discussed. For more information, see the paper, "The influence of X-ray coherence length on TXRF and XSW and the characterization of nanoparticles observed under grazing incidence of X-rays", A. von Bohlen et al., J. Anal. At. Spectrom., 2009 (advance article) DOI: 10.1039/b811178b