Nature Materials Insight devoted to electron and X-ray microscopy

In Issue 4, vol. 8 (2009) of Nature Materials, the Insight section features a compilation of articles on recent electron and X-ray microscopy. The aim is to illustrate what are the most outstanding capabilities of modern imaging techniques based on electrons and X-ray photons, which have been often treated separately. The 6 articles in the compilation are as follows: "Is science prepared for atomic-resolution electron microscopy?", Knut W. Urban (p.260-262); "Structure and bonding at the atomic scale by scanning transmission electron microscopy", David A. Muller (p.263-270); "Electron tomography and holography in materials science", Paul A. Midgley & Rafal E. Dunin-Borkowski (p.271-280); "Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials", Harald Ade & Herman Stoll (p.281-290); "Coherent X-ray diffraction imaging of strain at the nanoscale" Ian Robinson & Ross Harder (p.291-298); "X-ray imaging beyond the limits", Henry N. Chapman (p.299-301). Visit the Web page to download the full Insight as PDF file (4.77MB), http://www.nature.com/nmat/journal/v8/n4/pdf/nmat-insight-microscopy.pdf