The 3rd X-ray reflectivity school in Japan

Demand for learning analytical techniques for surfaces and interfaces appears to be on the increase. At Tsukuba in Japan, the 3rd tutorial course on the analysis of thin films and multilayers by X-ray reflectivity was held on May 22. The first Japanese textbook that serves as an introduction to X-ray reflectivity was published in February, and the 7 authors gave lectures as part of the course. Further information is available at http://www.nims.go.jp/xray/ref/ (in Japanese only).