The 4th X-ray reflectivity school in Japan

Demand for learning analytical techniques for surfaces and interfaces appears to be on the increase. In Tokyo, Japan, the 4th tutorial course on the analysis of thin films and multilayers by X-ray reflectivity was held on March 16. The first Japanese textbook that serves as an introduction to X-ray reflectivity was published in 2009 (also translated into Korean in 2010), and the 8 authors gave lectures as part of the course. Further information is available at http://www.nims.go.jp/xray/ref/ (in Japanese only).