Professor P. Dutta (University of Chicago) and his colleagues recently clarified that the surface density profile acquires layered structures at 0.2 Tc; Tc is the liquid-gas critical temperature. The present research was for dielectric liquids, pentaphenyl trimethyl trisiloxane, and pentavinyl pentamethyl cyclopentasiloxane. The X-ray reflectivity technique was employed to determine the surface profile experimentally. The research group had previously found similar phenomena for other liquid dielectric liquids as well as liquid metals. The present studies could strengthen their series of work. For more information, see the paper, "Surface order in cold liquids: X-ray reflectivity studies of dielectric liquids and comparison to liquid metals", S. Chattopadhyay et al., Phys. Rev, B81, 184206 (2010).
