Denver X-ray conference awards

The following awards were presented during the plenary session of the 59th Annual Denver X-Ray Conference: The 2010 Birks Award was presented to Victor Buhrke, Consultant, Portola Valley, CA to honor his significant contributions to the field of X-ray spectrometry. The 2010 Hanawalt Award was given to Takeshi Egami, University of Tennessee, Knoxville, TN and Simon Billinge, Columbia University, New York, NY. This award is presented every three years for an important, recent contribution to the field of powder diffraction.

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