A dimensional standard for micro X-ray computer tomography

Dr. B. M. Patterson (Los Alamos National Laboratory, USA) and his colleagues have recently published an interesting paper on analytical problems arising from micro X-ray computer tomography. They discussed the use of a dimensional standard based upon NIST certified glass microspheres dispersed in a low density poly(styrene) matrix. For more information, see the paper, "Dimensional Standard for Micro X-ray Computed Tomography", B. M. Patterson et al., Anal. Chem., Article ASAP (DOI: 10.1021/ac101522q Publication Date (Web): September 16, 2010).