2012 workshop on buried interface science with X-rays and neutrons

The 2012 workshop on buried interface science with X-rays and neutrons was held at KEK, Tsukuba, Japan, on June 26-28, 2012. This was the latest in a series of 18 workshops held since 2001. There are increasing demands for sophisticated metrology in order to observe multilayered materials with nano-structures (dots, wires, etc), which are finding applications in electronic, magnetic, optical and other devices. X-ray and neutron analysis is known for its ability to observe in a nondestructive manner even 'buried' function interfaces as well as the surface. In addition to such inherent advantages, recent remarkable advances in micro analysis and quick time-resolved analysis in X-ray reflectometry are extremely important. The latest progress in novel quantum beam technologies, such as XFELs, ERLs, as well as many other table-top laser-like machines could push such techniques towards further sophisticated applications. The present workshop gathered together those with different research backgrounds, i.e., from semiconductor electronics to chemical bio materials, and even theoretical groups were invited to give insights into unsolved problems on buried interfaces.